MEMS 1066 - METHODS FOR MATERIAL CHARACTERIZATION
Minimum Credits: 3
Maximum Credits: 3
This course offers a survey of analytical, microscopy, diffraction and other testing methods that are widely used for the characterization of composition, chemistry, structure, morphology, thermal, magnetic, electric, mechanical and other properties of materials from nano- to macro-scale. It introduces the most basic concepts required to understand experimental data obtained with these techniques. The main objectives of the course are to enable students to identify characterization methods that would result in given characterization problem, interpret and critically evaluate relevant data sets presented in the research literature. Some prerequisite basic knowledge of the structure of solid matter (e.g. Crystals and amorphous materials), diffraction methods (e.g. X-ray diffraction) and processing-property-structure relationships in materials is expected.
Academic Career: Undergraduate
Course Component: Lecture
Grade Component: Letter Grade
Click here for class schedule information.
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