ECE 2233 - FOCUSED ION BEAM AND SCANNING ELECTRON MICROSCOPY

Minimum Credits: 3
Maximum Credits: 3
Long Description This course introduces the basic theory of FIB, SEM, X-EDS, and EBSD instrumentation, milling, deposition, and analytical capabilities. It discusses and presents the theory directly related to applications and techniques used in FIB/SEM dual beam platform instruments. Throughout the course, the students will be exposed to these methods and required to apply them to real research projects either provided by the instructor or from their research supervisors.
Academic Career: Graduate
Course Component: Lecture
Grade Component: Grad Letter Grade

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