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MEMS 1048 - ANALYSIS AND CHARACTERIZATION AT THE NANO-SCALEMinimum Credits: 3 Maximum Credits: 3 Long Description This course offers a survey of micro-analytical, microscopy and diffraction methods that are widely used for the analysis of composition, chemistry, structure, scale and morphology of advanced materials. It introduces the most basic concepts required to understand experimental data obtained with these modern techniques. The main objectives of the course are to enable students to interpret and evaluate relevant data sets presented in the research literature and to identify experimental tools to solve a given Nano-research characterization problem. Some prerequisite basic knowledge of the structure of solid matter (e.g. crystals and amorphous materials), diffraction methods (e.g. X-ray diffraction) and processing-property-structure relationships in materials is expected. Academic Career: Undergraduate Course Component: Lecture Grade Component: Letter Grade Course Requirements: PROG: Swanson School of Engineering
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