ANALYSIS AND CHARACTERIZATION AT THE NANO-SCALE
2026-2027 Undergraduate Catalog
   

MEMS 1048 - ANALYSIS AND CHARACTERIZATION AT THE NANO-SCALE


Minimum Credits: 3
Maximum Credits: 3
Long Description This course offers a survey of micro-analytical, microscopy and diffraction methods that are widely used for the analysis of composition, chemistry, structure, scale and morphology of advanced materials. It introduces the most basic concepts required to understand experimental data obtained with these modern techniques. The main objectives of the course are to enable students to interpret and evaluate relevant data sets presented in the research literature and to identify experimental tools to solve a given Nano-research characterization problem. Some prerequisite basic knowledge of the structure of solid matter (e.g. crystals and amorphous materials), diffraction methods (e.g. X-ray diffraction) and processing-property-structure relationships in materials is expected.
Academic Career: Undergraduate
Course Component: Lecture
Grade Component: Letter Grade
Course Requirements: PROG: Swanson School of Engineering


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