SCANNING PROBE MICROSCOPY-BASED CHARACTERIZATION AND NANOFABRICATION   [Archived Catalog]
2020-2021 Graduate & Professional Studies Catalog
   
Print-Friendly Page (opens a new window)
Add to Portfolio.

ECE 2260 - SCANNING PROBE MICROSCOPY-BASED CHARACTERIZATION AND NANOFABRICATION

Minimum Credits: 3
Maximum Credits: 3
The course concentrates on both theoretical and practical issues of advanced scanning problem microscopy (SPM) techniques. It introduces concepts, theoretical backgrounds, and operation principles of varieties of scanning probe microscopies; addresses the fundamental physical phenomena underlying the SPM imaging mechanism; covers the practical aspects of SPM characterization of a wide range of materials as well as operation devices; discusses SPM-based approaches to nanofabrication and nanolithography such as dip-pen nanolithography and nano-robotic manipulation.
Academic Career: Graduate
Course Component: Lecture
Grade Component: Grad Letter Grade
Course Requirements: PROG: Swanson School of Engineering


Click here for class schedule information.


Print-Friendly Page (opens a new window)
Add to Portfolio.
Close Window
   
All catalogs © 2024 University of Pittsburgh.
Powered by the Acalog™ Academic Catalog Management System™ (ACMS™).