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CHE 2043 - ELECTRON MICROSCOPY IN MATERIALS SCIENCEMinimum Credits: 3 Maximum Credits: 3 Electron optics, lens aberrations, depth of field, depth of focus, resolution, contrast, bright and dark field microscopy, selected area diffraction, calibration, specimen preparation, electron scattering, electron diffraction, Bragg's law, Laue conditions, structure factor, Ewald construction, double diffraction, twinning, Kikuchi lines, contrast theory, kinematical theory of diffraction by perfect and imperfect crystals, limitations, column approximation, extinction contours, dynamical theory, special techniques, high voltage microscopy, applications. Academic Career: Graduate Course Component: Lecture Grade Component: Grad Letter Grade Course Requirements: PROG: Swanson School of Engineering
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